DIN 41538-1-1960 电子管的八脚管座.主要尺寸
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【英文标准名称】:Octalbaseforelectronpipes;maindimensions
【原文标准名称】:电子管的八脚管座.主要尺寸
【标准号】:DIN41538-1-1960
【标准状态】:作废
【国别】:德国
【发布日期】:1960-03
【实施或试行日期】:
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:电子管;尺寸;底座;底座;电气工程
【英文主题词】:bases;electricalengineering;electrontubes;dimensions;plinths
【摘要】:
【中国标准分类号】:L35
【国际标准分类号】:31_100
【页数】:1P;A4
【正文语种】:德语
【原文标准名称】:电子管的八脚管座.主要尺寸
【标准号】:DIN41538-1-1960
【标准状态】:作废
【国别】:德国
【发布日期】:1960-03
【实施或试行日期】:
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:电子管;尺寸;底座;底座;电气工程
【英文主题词】:bases;electricalengineering;electrontubes;dimensions;plinths
【摘要】:
【中国标准分类号】:L35
【国际标准分类号】:31_100
【页数】:1P;A4
【正文语种】:德语
下载地址: 点击此处下载
【英文标准名称】:MILLINGCUTTERS.RECOMMENDEDRANGEOFOUTSIDEDIAMETERS.
【原文标准名称】:金属铣刀.推荐的外径范围
【标准号】:NFE66-201-1966
【标准状态】:作废
【国别】:法国
【发布日期】:1966-09
【实施或试行日期】:1966-09-01
【发布单位】:法国标准化协会(AFNOR)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:直径;铣刀;机动工具;机床
【英文主题词】:
【摘要】:
【中国标准分类号】:J41
【国际标准分类号】:25_100_20
【页数】:1P;A4
【正文语种】:其他
【英文标准名称】:StandardTestMethodforWetInsulationIntegrityTestingofPhotovoltaicArrays
【原文标准名称】:光电阵列湿绝缘完整性测试的标准试验方法
【标准号】:ASTME2047-2010
【标准状态】:现行
【国别】:
【发布日期】:2010
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E44.09
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:电气测试;绝缘完整性;绝缘电阻;光电的;太阳能;电气性能-太阳能设备;光电动力系统;湿绝缘完整性
【英文主题词】:electricaltesting;insulationintegrity;insulationresistance;photovoltaics;solarenergy;Electricalperformance--solardevices;Insulationresistance;Photovoltaic(PV)powersystems;Solarenergy;Wetinsulationintegrity
【摘要】:ThedesignofaPVmoduleorsystemintendedtoprovidesafeconversionofthesun''sradiantenergyintousefulelectricitymusttakeintoconsiderationthepossibilityofhazardshouldtheusercomeintocontactwiththeelectricalpotentialofthearray.Inaddition,theinsulationsystemprovidesabarriertoelectrochemicalcorrosion,andinsulationflawscanresultinincreasedcorrosionandreliabilityproblems.Thistestmethoddescribesaprocedureforverifyingthatthedesignandconstructionofthearrayprovidesadequateelectricalisolationthroughnormalinstallationanduse.AtnolocationonthearrayshouldthePV-generatedelectricalpotentialbeaccessible,withtheobviousexceptionoftheoutputleads.Theisolationisnecessarytoprovideforsafeandreliableinstallation,use,andserviceofthePVsystem.Thistestmethoddescribesaprocedurefordeterminingtheabilityofthearraytoprovideprotectionfromelectricalhazards.Itsprimaryuseistofindinsulationflawsthatcouldbedangeroustopersonswhomaycomeintocontactwiththearray.Correctiveactiontakentoaddresssuchflawsisbeyondthescopeofthistestmethod.Thisproceduremaybespecifiedaspartofaseriesofacceptancetestsinvolvingperformancemeasurementsanddemonstrationoffunctionalrequirements.Largearrayscanbetestedinsmallersegments.Thesizeofthearraysegmenttobetested(calledx201C;circuitundertestx201D;inthistestmethod)isusuallyselectedataconvenientbreakpointandsizedsuchthattheexpectedresistanceorcurrentreadingiswithinthemiddlethirdofthemeter''srange.Insulationleakageresistanceandinsulationleakagecurrentleakagearestrongfunctionsofarraydimensions,ambientrelativehumidity,absorbedwatervapor,andotherfactors.Forthisreason,itistheresponsibilityoftheuserofthistestmethodtospecifytheminimumacceptableleakageresistanceforthistest.Eventhoughanumericalquantityisspecified,actualresultsareoftenpass-failinthatwhenaflawisfound,theleakagecurrentchangesfromalmostnothingtothefullscalevalueonthemeter.Theuserofthistestmethodmustspecifytheoptionusedforconnectiontothearrayduringthetest.Theshort-circuitedoptionrequiresashortingdevicewithleadstoconnectthepositiveandnegativelegsofthecircuitundertest.Forlargersystems,wheretheshortingdevicemayhavetoberatedforhighcurrentandvoltagelevels,theopen-circuitedoptionmaybepreferred.Theopen-circuitedoptionrequirestheusertocorrectreadingstoaccountforthePV-generatedvoltage,andtheprocedureformakingsuchcorrectionsisbeyondthescopeofthistestmethod.Theshort-circuitedoptionmaybeeasierforsmallsystemswherethevoltageandcurrentlevelsarelowandthedistancebetweentheplusandminusleadsofthecircuitundertestaresmall.Theshort-circuitedoptionminimizesthechanceofexposingarraycomponentstovoltagelevelsabovethoseforwhichtheyarerated.1.1Thistestmethodcoversaproceduretodeterminetheinsulationresistanceofaphotovoltaic(PV)array(oritscomponentstrings),thatis,theelectricalresistancebetweenthearray''sinternalelectricalcomponentsandisexposed,electricallyconductive,non-currentcarryingpartsandsurfacesofthearray.1.2Thistestmethoddoesnotestablishpassorfaillevels.Thedeterminationofacceptableorunacceptableresultsisbeyondthescopeofthistestmethod.1.3ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.4Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itis......
【中国标准分类号】:F12
【国际标准分类号】:27_160
【页数】:4P.;A4
【正文语种】:
【原文标准名称】:金属铣刀.推荐的外径范围
【标准号】:NFE66-201-1966
【标准状态】:作废
【国别】:法国
【发布日期】:1966-09
【实施或试行日期】:1966-09-01
【发布单位】:法国标准化协会(AFNOR)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:直径;铣刀;机动工具;机床
【英文主题词】:
【摘要】:
【中国标准分类号】:J41
【国际标准分类号】:25_100_20
【页数】:1P;A4
【正文语种】:其他
【英文标准名称】:StandardTestMethodforWetInsulationIntegrityTestingofPhotovoltaicArrays
【原文标准名称】:光电阵列湿绝缘完整性测试的标准试验方法
【标准号】:ASTME2047-2010
【标准状态】:现行
【国别】:
【发布日期】:2010
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E44.09
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:电气测试;绝缘完整性;绝缘电阻;光电的;太阳能;电气性能-太阳能设备;光电动力系统;湿绝缘完整性
【英文主题词】:electricaltesting;insulationintegrity;insulationresistance;photovoltaics;solarenergy;Electricalperformance--solardevices;Insulationresistance;Photovoltaic(PV)powersystems;Solarenergy;Wetinsulationintegrity
【摘要】:ThedesignofaPVmoduleorsystemintendedtoprovidesafeconversionofthesun''sradiantenergyintousefulelectricitymusttakeintoconsiderationthepossibilityofhazardshouldtheusercomeintocontactwiththeelectricalpotentialofthearray.Inaddition,theinsulationsystemprovidesabarriertoelectrochemicalcorrosion,andinsulationflawscanresultinincreasedcorrosionandreliabilityproblems.Thistestmethoddescribesaprocedureforverifyingthatthedesignandconstructionofthearrayprovidesadequateelectricalisolationthroughnormalinstallationanduse.AtnolocationonthearrayshouldthePV-generatedelectricalpotentialbeaccessible,withtheobviousexceptionoftheoutputleads.Theisolationisnecessarytoprovideforsafeandreliableinstallation,use,andserviceofthePVsystem.Thistestmethoddescribesaprocedurefordeterminingtheabilityofthearraytoprovideprotectionfromelectricalhazards.Itsprimaryuseistofindinsulationflawsthatcouldbedangeroustopersonswhomaycomeintocontactwiththearray.Correctiveactiontakentoaddresssuchflawsisbeyondthescopeofthistestmethod.Thisproceduremaybespecifiedaspartofaseriesofacceptancetestsinvolvingperformancemeasurementsanddemonstrationoffunctionalrequirements.Largearrayscanbetestedinsmallersegments.Thesizeofthearraysegmenttobetested(calledx201C;circuitundertestx201D;inthistestmethod)isusuallyselectedataconvenientbreakpointandsizedsuchthattheexpectedresistanceorcurrentreadingiswithinthemiddlethirdofthemeter''srange.Insulationleakageresistanceandinsulationleakagecurrentleakagearestrongfunctionsofarraydimensions,ambientrelativehumidity,absorbedwatervapor,andotherfactors.Forthisreason,itistheresponsibilityoftheuserofthistestmethodtospecifytheminimumacceptableleakageresistanceforthistest.Eventhoughanumericalquantityisspecified,actualresultsareoftenpass-failinthatwhenaflawisfound,theleakagecurrentchangesfromalmostnothingtothefullscalevalueonthemeter.Theuserofthistestmethodmustspecifytheoptionusedforconnectiontothearrayduringthetest.Theshort-circuitedoptionrequiresashortingdevicewithleadstoconnectthepositiveandnegativelegsofthecircuitundertest.Forlargersystems,wheretheshortingdevicemayhavetoberatedforhighcurrentandvoltagelevels,theopen-circuitedoptionmaybepreferred.Theopen-circuitedoptionrequirestheusertocorrectreadingstoaccountforthePV-generatedvoltage,andtheprocedureformakingsuchcorrectionsisbeyondthescopeofthistestmethod.Theshort-circuitedoptionmaybeeasierforsmallsystemswherethevoltageandcurrentlevelsarelowandthedistancebetweentheplusandminusleadsofthecircuitundertestaresmall.Theshort-circuitedoptionminimizesthechanceofexposingarraycomponentstovoltagelevelsabovethoseforwhichtheyarerated.1.1Thistestmethodcoversaproceduretodeterminetheinsulationresistanceofaphotovoltaic(PV)array(oritscomponentstrings),thatis,theelectricalresistancebetweenthearray''sinternalelectricalcomponentsandisexposed,electricallyconductive,non-currentcarryingpartsandsurfacesofthearray.1.2Thistestmethoddoesnotestablishpassorfaillevels.Thedeterminationofacceptableorunacceptableresultsisbeyondthescopeofthistestmethod.1.3ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.4Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itis......
【中国标准分类号】:F12
【国际标准分类号】:27_160
【页数】:4P.;A4
【正文语种】:
